Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy

doi:10.1007/s11467-020-0994-0

SIC OpenIR

	Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy
	Zheng, ZY; Pan, YH; Pei, TF; Xu, R; Xu, KQ; Lei, L; Hussain, S; Liu, XJ; Bao, LH; Gao, HJ; Ji, W; Cheng, ZH
	2020-10-08
Source Publication	FRONTIERS OF PHYSICS
ISSN	2095-0462
Issue	6
Subtype	Article
Abstract	The interlayer bonding in two-dimensional (2D) materials is particularly important because it is not only related to their physical and chemical stability but also affects their mechanical, thermal, electronic, optical, and other properties. To address this issue, we report the direct characterization of the interlayer bonding in 2D SnSe using contact-resonance atomic force microscopy (CR-AFM) in this study. Site-specific CR spectroscopy and CR force spectroscopy measurements are performed on both SnSe and its supporting SiO2/Si substrate comparatively. Based on the cantilever and contact mechanic models, the contact stiffness and vertical Young's modulus are evaluated in comparison with SiO2/Si as a reference material. The interlayer bonding of SnSe is further analyzed in combination with the semi-analytical model and density functional theory calculations. The direct characterization of interlayer interactions using this non-destructive methodology of CR-AFM would facilitate a better understanding of the physical and chemical properties of 2D layered materials, specifically for interlayer intercalation and vertical heterostructures.
DOI	10.1007/s11467-020-0994-0
WOS Keyword	HETEROSTRUCTURES ; EXCITATION ; FREQUENCY
Language	英语
WOS Research Area	Physics
Publisher	HIGHER EDUCATION PRESS
Citation statistics
Document Type	期刊论文
Identifier	http://ir.sic.ac.cn/handle/331005/27699
Collection	中国科学院上海硅酸盐研究所
Recommended Citation GB/T 7714	Zheng, ZY,Pan, YH,Pei, TF,et al. Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy[J]. FRONTIERS OF PHYSICS,2020(6).
APA	Zheng, ZY.,Pan, YH.,Pei, TF.,Xu, R.,Xu, KQ.,...&Cheng, ZH.(2020).Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy.FRONTIERS OF PHYSICS(6).
MLA	Zheng, ZY,et al."Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy".FRONTIERS OF PHYSICS .6(2020).

Files in This Item:
There are no files associated with this item.

If you have any objections to this item, please fill out the form below and the administrator will contact you as soon as possible.
Content:
Email：	*
Institution:
Verification Code:	Refresh

Any comments and suggestions are welcomed.
Title:	*
Content:
Email：	*
Verification Code:	Refresh

中国科学院上海硅酸盐研究所机构知识库