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Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy
Zheng, ZY; Pan, YH; Pei, TF; Xu, R; Xu, KQ; Lei, L; Hussain, S; Liu, XJ; Bao, LH; Gao, HJ; Ji, W; Cheng, ZH
2020-10-08
Source PublicationFRONTIERS OF PHYSICS
ISSN2095-0462
Issue6
SubtypeArticle
AbstractThe interlayer bonding in two-dimensional (2D) materials is particularly important because it is not only related to their physical and chemical stability but also affects their mechanical, thermal, electronic, optical, and other properties. To address this issue, we report the direct characterization of the interlayer bonding in 2D SnSe using contact-resonance atomic force microscopy (CR-AFM) in this study. Site-specific CR spectroscopy and CR force spectroscopy measurements are performed on both SnSe and its supporting SiO2/Si substrate comparatively. Based on the cantilever and contact mechanic models, the contact stiffness and vertical Young's modulus are evaluated in comparison with SiO2/Si as a reference material. The interlayer bonding of SnSe is further analyzed in combination with the semi-analytical model and density functional theory calculations. The direct characterization of interlayer interactions using this non-destructive methodology of CR-AFM would facilitate a better understanding of the physical and chemical properties of 2D layered materials, specifically for interlayer intercalation and vertical heterostructures.
DOI10.1007/s11467-020-0994-0
WOS KeywordHETEROSTRUCTURES ; EXCITATION ; FREQUENCY
Language英语
WOS Research AreaPhysics
PublisherHIGHER EDUCATION PRESS
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sic.ac.cn/handle/331005/27699
Collection中国科学院上海硅酸盐研究所
Recommended Citation
GB/T 7714
Zheng, ZY,Pan, YH,Pei, TF,et al. Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy[J]. FRONTIERS OF PHYSICS,2020(6).
APA Zheng, ZY.,Pan, YH.,Pei, TF.,Xu, R.,Xu, KQ.,...&Cheng, ZH.(2020).Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy.FRONTIERS OF PHYSICS(6).
MLA Zheng, ZY,et al."Local probe of the interlayer coupling strength of few-layers SnSe by contact-resonance atomic force microscopy".FRONTIERS OF PHYSICS .6(2020).
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