KMS Shanghai Institute of Ceramics，Chinese Academy of Sciences
| Optical and Electrical Characterization of Pure PMMA for Terahertz Wide-band Metamaterial Absorbers | |
| Shi, Zaiying; Song, Lixin; Zhang, Tao | |
| 2019 | |
| Source Publication | JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES
 |
| ISSN | 1866-6892 |
| Volume | 40Issue:1Pages:80 |
| Subtype | Article |
| Abstract | The characteristics of relative permittivity and reflectance for poly (methyl methacrylate) (PMMA) films prepared by spin-coating were investigated and an excellent wideband terahertz (THz) metamaterial absorber (MA) had been fabricated by employing PMMA film as the dielectric layer. XRD and AFM indicated that all the PMMA films with thicknesses from 11 to 17m were amorphous and extremely smooth with roughness about 0.203nm. Raman results demonstrated that vibration strength of the same covalent bonds tends to be consistent with an increase in film thickness. The dual beam laser interferometer (DBLI) was employed to study the influence of applied frequency and thickness on the relative permittivity, and the results exhibited dielectric constants increased from 2.88 to 4.04 with the thickness increasing from 9 to 14m. And the dielectric constants for PMMA films with a certain thickness (8m) gradually declined when the applied frequency increased from 100 to 10(5)Hz; besides, the dielectric constant in THz band was forecasted approximately 2.5. The terahertz time domain spectrometer (THz-TDS) results revealed that the THz reflectance was of gradual degradation from 80 to 58% at 3.2THz, as the thickness increased from 11 to 17m. In addition, the UV-VIS spectrum showed that thickness had little effect on reflectance and transmittance in visible region, leading to the almost same E-g (energy gap) about 3.7eV. At last, by employing PMMA film as the dielectric layer, a highly wideband metamaterial absorber with absorption >80% from 4.1 to 7.4THz was fabricated. |
| Keyword | PMMA Terahertz Permittivity Reflectance Metamaterial absorber |
| DOI | 10.1007/s10762-018-0553-8 |
| Language | 英语 |
| WOS Research Area | Engineering ; Optics ; Physics |
| Publisher | SPRINGER |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sic.ac.cn/handle/331005/27433 |
| Collection | 中国科学院上海硅酸盐研究所 |
| Recommended Citation GB/T 7714 | Shi, Zaiying,Song, Lixin,Zhang, Tao. Optical and Electrical Characterization of Pure PMMA for Terahertz Wide-band Metamaterial Absorbers[J]. JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES,2019,40(1):80. |
| APA | Shi, Zaiying,Song, Lixin,&Zhang, Tao.(2019).Optical and Electrical Characterization of Pure PMMA for Terahertz Wide-band Metamaterial Absorbers.JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES,40(1),80. |
| MLA | Shi, Zaiying,et al."Optical and Electrical Characterization of Pure PMMA for Terahertz Wide-band Metamaterial Absorbers".JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES 40.1(2019):80. |
| Files in This Item: | There are no files associated with this item. | |||||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment