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A New Method of Accurately Measuring Photoconductive Performance of 4H-SiC Photoconductive Switches
Han, Wei-Wei; Huang, Wei; Zhuo, Shi-Yi; Xin, Jun; Liu, Xue-Chao; Shi, Er-Wei; Zhang, Yue-Fan; Cao, Peng-Hui; Wang, Yu-Tian; Guo, Hui; Zhang, Yu-Ming
2019-02-01
Source PublicationIEEE ELECTRON DEVICE LETTERS
ISSN0741-3106
Volume40Issue:2Pages:271
SubtypeArticle
AbstractA new method of accurately measuring the photoconductive performance of photoconductive semiconductor switch (PCSS) was proposed. By this method, we succeeded extracting the photoconductivity of 4H-SiC substrate free from the obstruction of parasitic inductance in the test circuit. Photoconductive performance of the PCSS was precisely measured, where a maximum ON-state photoconductivity of 6.26 (Omega . m)(-1), a minimum ON-state resistivity of 0.16 Omega.m, and an accurate minimum resistance of 1.71 Omega were obtained for SiC substrate. The quantitative relationship between the ON-state resistance and the reciprocal of area of laser trigger region was proved. The performance of PCSSs can be continuously adjusted to adapt different application requirements just by changing the area of laser excitation region.
KeywordPhotoconductive switch silicon carbide intrinsic photoconductivity pulse-power system switches on-state resistance
DOI10.1109/LED.2018.2885787
Language英语
WOS Research AreaEngineering
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sic.ac.cn/handle/331005/27365
Collection中国科学院上海硅酸盐研究所
Recommended Citation
GB/T 7714
Han, Wei-Wei,Huang, Wei,Zhuo, Shi-Yi,et al. A New Method of Accurately Measuring Photoconductive Performance of 4H-SiC Photoconductive Switches[J]. IEEE ELECTRON DEVICE LETTERS,2019,40(2):271.
APA Han, Wei-Wei.,Huang, Wei.,Zhuo, Shi-Yi.,Xin, Jun.,Liu, Xue-Chao.,...&Zhang, Yu-Ming.(2019).A New Method of Accurately Measuring Photoconductive Performance of 4H-SiC Photoconductive Switches.IEEE ELECTRON DEVICE LETTERS,40(2),271.
MLA Han, Wei-Wei,et al."A New Method of Accurately Measuring Photoconductive Performance of 4H-SiC Photoconductive Switches".IEEE ELECTRON DEVICE LETTERS 40.2(2019):271.
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