An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures

doi:10.3390/ma12071141

SIC OpenIR

	An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures
	Ma, Jiayu; Zhang, Yuzhi; Wu, Lingnan; Li, Haogeng; Song, Lixin
	2019-04-10
Source Publication	MATERIALS
ISSN	1996-1944
Volume	12 Issue:7
Subtype	Article
Abstract	Thermal control materials are employed to adjust the temperature of a spacecraft operating in deep space. The spectral emissivity is a crucial factor in evaluating the thermal radiative properties of such materials. An apparatus, composed of a Fourier transform infrared spectrometer (FTIR), a sample cooling chamber and a mechanical modulation system was demonstrated to measure low temperature infrared spectral emissivity under vacuum. The mechanical modulation system, which includes a chopper and a lock-in amplifier, is employed to reduce the interference of background radiation during measurements. The limitation of the Fourier transform frequency on the chopper frequency can be eliminated by setting the FTIR on step-scan mode. The apparatus is separated into two parts and evacuated by different pumps. In this study, a high quality emission spectrum of a sample is measured by the apparatus. The spectral emissivity of thermal control materials are obtained in the wavelength range of 8 to 14 m at 173 and 213 K. The combined standard uncertainty of the apparatus is 3.30% at 213 K.
Keyword	spectral emissivity radiation vacuum low temperature
DOI	10.3390/ma12071141
Language	英语
WOS Research Area	Materials Science
Publisher	MDPI
Citation statistics	Cited Times:3[WOS] [WOS Record] [Related Records in WOS]
Document Type	期刊论文
Identifier	http://ir.sic.ac.cn/handle/331005/27195
Collection	中国科学院上海硅酸盐研究所
Recommended Citation GB/T 7714	Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,et al. An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures[J]. MATERIALS,2019,12(7).
APA	Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,Li, Haogeng,&Song, Lixin.(2019).An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures.MATERIALS,12(7).
MLA	Ma, Jiayu,et al."An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures".MATERIALS 12.7(2019).

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