KMS Shanghai Institute of Ceramics,Chinese Academy of Sciences
Theoretical modeling of detectivity of magnetoelectric magnetic sensor and ultra-high magnetic detectivity of Metglas/PMNT/Metglas laminates | |
Yang, Linrong1,2; Ma, Jiashuai1,2; Fang, Cong1,2; Yao, Meng1,2; Di, Wenning1; Zhao, Xiangyong1; Luo, Haosu1 | |
2017 | |
Source Publication | Physica Status Solidi (A) Applications and Materials Science
![]() |
ISSN | 18626300 |
Volume | 214Issue:7 |
Abstract | 43 |
DOI | 10.1002/pssa.201700016 |
EI Accession Number | 20171703595777 |
EI Keywords | Dielectric losses - Magnetism - Signal to noise ratio |
EI Classification Number | Compendex |
Citation statistics | |
Document Type | 期刊论文 |
Identifier | http://ir.sic.ac.cn/handle/331005/26097 |
Collection | 中国科学院上海硅酸盐研究所 |
Affiliation | 1.Key Laboratory of Inorganic Functional Material and Device, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai; 201800, China; 2.Graduate School of the Chinese Academy of Sciences, Beijing; 100049, China |
Recommended Citation GB/T 7714 | Yang, Linrong,Ma, Jiashuai,Fang, Cong,et al. Theoretical modeling of detectivity of magnetoelectric magnetic sensor and ultra-high magnetic detectivity of Metglas/PMNT/Metglas laminates[J]. Physica Status Solidi (A) Applications and Materials Science,2017,214(7). |
APA | Yang, Linrong.,Ma, Jiashuai.,Fang, Cong.,Yao, Meng.,Di, Wenning.,...&Luo, Haosu.(2017).Theoretical modeling of detectivity of magnetoelectric magnetic sensor and ultra-high magnetic detectivity of Metglas/PMNT/Metglas laminates.Physica Status Solidi (A) Applications and Materials Science,214(7). |
MLA | Yang, Linrong,et al."Theoretical modeling of detectivity of magnetoelectric magnetic sensor and ultra-high magnetic detectivity of Metglas/PMNT/Metglas laminates".Physica Status Solidi (A) Applications and Materials Science 214.7(2017). |
Files in This Item: | There are no files associated with this item. |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment